Tensormeter - the new standard of resistance measurements
With the tensormeter, all components of the electrical resistance of thin layers such as silicon wafers can be measures quickly, easily and precisely with one measurement. The tensormeter determines the complete resistance tensor of one or more thin-film samples, which otherwise requires a large number of measuring devices and complex measurement setups. In addition, the tensormeter measures precisely in high resolution and with the lowest possible noise without sample structuring (e.g. lithography).