With the tensormeter, all components of the electrical resistance of thin layers, such as silicon wafers, can be measured quickly and precisely with one measurement. The tensormeter determines the complete resistance tensor of one or more thin-film samples, which would otherwise require a large number of measuring devices and complex measurement setups. In addition, the tensormeter measures precisely in high resolution and with the lowest noise without sample structuring (e.g. lithography).
Your benefits at a glance:
Tensormeter can be used for a variety of measuring applications within thin film characterization, wafer and device testing as well as materials research.
With only one device and one automated measurement a full set of electrical parameters can be derived for a comprehensive electrical sample characterization.
Get in touch with the Tensormeter – the new standard of resistance measurement. You can buy the Tensormeter to get the unlimited performance. You can rent the device to try it in your lab or you can send us your samples for first test measurements.
Find out more about Tensormeter
Dr. Tobias Kosub, Technical Development
Phone: +49 351 260 2900
t.kosub@hzdri.de
Dr. Stefanie Hartmann, Sales
Phone: +49 351 260 2710
s.hartmann@hzdri.de
