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With the tensormeter, all components of the electrical resistance of thin layers, such as silicon wafers, can be measured quickly and precisely with one measurement. The tensormeter determines the complete resistance tensor of one or more thin-film samples, which would otherwise require a large number of measuring devices and complex measurement setups. In addition, the tensormeter measures precisely in high resolution and with the lowest noise without sample structuring (e.g. lithography).
Your benefits at a glance:
Tensormeter can be used for a variety of measuring applications within thin film characterization, wafer and device testing as well as materials research.
With only one device and one automated measurement a full set of electrical parameters can be derived for a comprehensive electrical sample characterization.
Dr. Tobias Kosub, Technical Development
Phone: +49 351 260 2900
t.kosub@hzdri.de
Dr. Stefanie Hartmann, Sales
Phone: +49 351 260 2710
s.hartmann@hzdri.de
